Kaznatcheev, KV; Karunakaran, C; Lanke, UD; Urquhart, SG; Obst, M; Hitchcock, AP: Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 582(1), 96-99 (2007), online: 12.08.2007, doi:10.1016/j.nima.2007.08.083 [Link]

The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU), a beamline based on a collimated PGM optimized for 100–2000 eV range and two end stations: scanning transmission X-ray microscope (STXM) and roll-in X-ray photoemission electron microscope (X-PEEM, from Elmitec GmbH). The overall system has achieved its design parameters with an on-sample flux of ∼108 ph/s@R=3000, 0.5 A in STXM and ∼1012 ph/s@R=3000, 0.5 A in the PEEM, in each case at a spatial resolution exceeding 40 nm. It can also provide an energy resolving power above 10,000. A careful EPU calibration procedure enables advanced polarization measurements.

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